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Read on to see how to determine if you should you use a differential pair in your test coupon and pay for a 4-port measurement, or use a single-ended test line and only pay for a 2-port measurement.

The Electronic Design Innovation Conference and Exhibition (EDI CON) USA announced the addition of a the High-Speed Digital Symposium to its conference line up during the event at the Hynes Convention Center, September 11-13 in Boston, Mass.

In this DDR 101 introductory piece, learn about the fundamentals of a DDR interface and some basics of physical-layer testing.

Silicon Labs has introduced a new family of high performance crystal oscillators (XO) offering the industry's lowest jitter frequency-flexible solution.

Component simulations cannot be properly compared to measurements without de-embedding the test fixture—here’s step-by-step instructions to get the job done well.

The Electronic Design Innovation Conference and Exhibition (EDI CON) USA, the first industry event to bring together RF/microwave and high-speed digital design engineers and system integrators, announced the addition of a full day of training to its conference program at the Hynes Convention Center, September 11-13 in Boston, Mass.

Reducing electromagnetic interference (EMI) is a key challenge when designing electronic devices. In this article, we will take a look into EMI challenges, the role of board-level shields (BLS) in reducing EMI, and the key criteria to keep in mind when selecting BLS.

Levent Sevgi, who has worked with electromagnetics for almost three decades, wrote this book to address the breadth of EMC engineering topics that are not covered by more specialized texts: market control, accreditation, calibration, EMC testing and measurement and mitigation.