TS 23 Set Coming Soon: TroubleStar for ESD/Burst Troubleshooting

Area of Application

The TS 23 set is a system of EMC tools for pre-compliance immunity tests. It is intended to be used for troubleshooting and weak point analysis of electronics at all system levels. A possible application scenario for the set is for electronics that have not passed an EMC immunity test and need to be modified. 

Another area of applications is to use the set for pre-compliance tests in an early stage of development to find weak points and reduce the risk of failing EMC tests. The tests whose failure patterns can be reproduced are immunity test against fast transient/burst (IEC 61000-4-4) and immunity tests against electrostatic discharge (ESD) (IEC 61000-4-2).

Scope of Delivery

Technical Parameters

• Rise time 1.5 ns
• Pulse voltage 0.01 kV to 2.2 kV
• Pulse width 12 ns
• Maximum repetition frequency 1.5 kHz

TS 2 Mini Burst Field Generators in Pocket Size

The P1 set with the three mini burst field generators is used to quickly test the immunity of assemblies. They are a quick alternative to EMC test stations, where larger generators have to be set up and put into operation at a laboratory workstation, which is time-consuming.

The pocket-sized mini burst field generators can be put into operation immediately without any additional measures. This enables fast, flexible testing of electronic systems.

At their tip, they generate burst or ESD-like interference fields with an interference pulse of 2/8 ns.

The mini burst field generators are guided by hand with their field-emitting tips close to the test object (e.g. printed circuit board). They are most effective when they are placed directly on the surface of the device under test.

The weak points react to the pulse field and functional faults can be triggered. In the device under test, weak points can be found specifically on individual sections of the PCB design (faults in the ground system, individual conductor tracks or IC pins). The separation of magnetic (P11 and P12) and electrical (P21) coupling enables optimum adaptation of the EMC countermeasures to a weak point.

Figure 1. P1 set.

Figure 1 shows the three generators (from the P1 set). Each of the generators fulfils a specific task.

P11 mini burst field generator generates a magnetic field that emerges axially from the tip. The magnetic field can be used to test current and signal loops in the module for interference immunity. It can also be coupled into the surface of ICs in order to hit the die of the IC.

P12 mini burst field generator generates a magnetic field that emerges in a circle from the tip. The magnetic field of this mini burst field generator can selectively detect IC pins and conductors and induce an interference voltage in them. The (sensitivity tester) P12 can be used to test the sensitivity of IC inputs and conductors.

The P21 mini burst field generator generates an axial electric field at its tip. The tip is shaped in such a way that the field electrode can be placed longitudinally on conductor runs for coupling. This enables intensive direct coupling. Active inputs of ICs (reset, clock) react particularly sensitively if they have high-impedance drivers (pull-up or pull-down resistors).

Figure 2. Applications of the mini burst field generators from P1 set. 

Figure 3 shows the use of the P12 pulser when interference current is coupled into a VDD/VSS capacitor of the microcontroller. The interference current can briefly reduce the supply voltage in the IC and switch off the IC for a few nanoseconds.

Figure 3. Magnetic field coupling into the VDD systems of an IC.

Figure 4 shows the application of the mini burst field generator P21 on a quartz oscillator. This demonstrates that the module can be disturbed via the quartz oscillator when exposed to an electric field.

Figure 4. Coupling of electric field into a quartz oscillator.

The mini burst field generators are used to analyze flat assemblies during development. The generator's field source generates ESD/burst-like pulsed fields limited to a few mm².

The adjustable intensity of the disturbance variable means that weak points can be compared with each other and the effectiveness of EMC measures can be checked. The separation of magnetic coupling (B-pulser P11, red) and electrical coupling (E-pulser P21, blue) enables magnetic and electrical weak points to be differentiated and the countermeasure corresponding to the cause-effect relationship (E/H) to be determined.

TroubleStar ESD/Burst: Universal Applicability of the TS 23

The TS 23 generates ESD-like interference pulses that differ significantly from a burst generator, particularly in terms of the edge steepness. The interference pulse of the TS 23 with 1.5/50 ns can penetrate DUT (devices under test) approx. four times more effectively than the 5/50 ns burst interference pulse. Due to the edge steepness of 1.5 ns, the pulse has a similar effect to an ESD process.

The practical application of the generator is more effective than its predecessor, the SGZ 21, due to the differential output and the 50 Ω generator cable. The SGZ 21 has simple cables as generator cables which, depending on their length and inductance, inhibit the interference process. The 50 Ω cables do not change the interference pulse and lead it uninhibited to the device under test where it can act directly via short connections (see Figure 5).

Figure 5. New coupling system for flat modules. ESD interference is coupled into 50 Ω cables and magnetic base adapters into printed circuit boards.

The following examples show the universal applicability of the TS 23. 

In addition to the classic application for component interference suppression, the TS 23 has a wider range of applications than the SGZ 21 and other interference generators. 

Due to the symmetrical output, special new types of magnetic field sources (probes) can be used. Figure 6 shows the BS 03-d magnetic field source, which generates a high magnetic flux density. A strong E-field suppression is realized by the differential supply. The special linear tip of the probe enables coupling into the power supply lines of ICs. This probe makes it possible to switch off the power supply in the IC and thus disrupt the IC.

Figure 6. Differentially fed magnetic field source BS 03d for generating high magnetic flux densities for universal use on printed circuit boards and ICs.

The BS 06DB-s probe works in a similar way to the BS 03-d probe. However, it generates an axially emitting focused magnetic field. This can be used to switch off local power supply areas in the IC and thus disrupt the IC locally.

Figure 7. Magnetic field source BS 06DB-s for generating high magnetic flux densities especially for disturbing ICs in the field of IC safety.

An IC stripline (μSL 80A) in conjunction with the TroubleStar TS 23 is suitable for testing the EMC properties of ICs - especially the resistance to fast ESD pulse fields.

The differential supply results in a high E-field suppression so that the magnetic influence is selectively tested (see Figure 8).

Figure 8. Application of the TroubleStar TS 23 for feeding an IC stripline. Enables the testing of ICs with fast transient magnetic fields.

Similar results can be achieved with a TEM cell, but in the case of the TEM cell JM3 shown here (see Figure 9), the coupling Lh with 45 pH is considerably smaller than the coupling of the IC stripline μSL 80A with 277 pH. The test depth is considerably lower with this TEM cell.

Figure 9. Using the TroubleStar TS 23 to supply a TEM cell enables ICs to be tested with fast transient magnetic fields.

These tests can also be carried out with the field source of the IC test system from Langer EMV-Technik GmbH (see Figure 10). The coupling at a height H of 10 mm is 181 pH and at a height of 3 mm it is approx. 360 pH. This means that a relatively high coupling can be achieved with a low height H.

The height H can be changed as required by replacing the spacer ring.

The P1600 field source can be used to generate fast transient magnetic fields. This enables comprehensive testing of ICs with electrical and magnetic transient fields.

Figure 10. Application of the TroubleStar TS 23 to supply a field source of the IC test system of Langer EMV-Technik GmbH. Enables the testing of ICs with fast transient magnetic fields.

Langer SDK: Now Available for Linux Systems

The Langer Scanner SDK now supports Linux operating systems, enabling customers to develop custom automation software for the ICS 105 and FLS 106 positioning systems on their preferred platform. This development provides greater flexibility for users who wish to integrate the precision 3- and 4-axis positioning systems into their Linux-based measurement environments. The SDK includes a shared library (.so) that offers the same precise control capabilities as the Windows implementation, making it ideal for near-field measurements above ICs and electronic assemblies.

This SDK is distinct from the ChipScan-Scanner software, as it provides developers with the fundamental tools to create their own customized measurement and automation solutions. Whether running on Windows or Linux, the SDK maintains the same robust functionality for automated positioning control, enabling seamless integration into existing test environments.