March 28, 2017

10 Tips for Best Board Design Practices for IoT Applications
By Eric Bogatin, editor SI Journal and CU, Boulder, Keith Graham, Vivek Sankaranarayanan, and Sairam Muttavarapu, CU, Boulder

This design guide focuses on small form factor and low power IoT products. Even though these sorts of products are not in the same performance class as server motherboards, not paying attention to signal and power integrity design principles at the beginning of the design cycle may require multiple board spins to get your IoT product working.

Rohde & Schwarz Helps Developers Optimize Power Supplies in Wireless Devices

The new R&S RT-ZVC02/04 multichannel power probe can measure across large current and voltage ranges without having to switch ranges.

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	Power-Aware Analysis Solution By Cadence Design Systems Inc.   This paper explains how a general power-aware SI solution not only should be capable of performing SSN simulations, but also capable of creating and extracting signal and power analysis-required models and running design checks with power-aware constraints.

Speed Meets Accuracy in a New EM Scanning Technique
By EMScan

A new scanning technique is available that delivers both speed and accuracy, with the ability to precisely pinpoint emissions in just minutes, even from inside an integrated circuit or microchip.

EDI CON USA 2017 Opens Call for Abstracts

EDI CON USA 2017, an event that brings together engineers working on high-frequency analog and high-speed digital designs, will take place at the Hynes Convention Center, September 11-13 in Boston, Mass.

MACOM Announces PAM-4 Technology Chipset for Single Lambda 100G, 200G and 400G Data Center Optical Connectivity

MACOM Technology Solutions Inc. announced a complete PAM-4 technology chipset for 100G data rates over a single wavelength enabling single fiber and four-lane parallel fiber connectivity for 100G, 200G and 400G Ethernet applications.
 

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	EUT Monitoring with Digital Oscilloscopes By Rohde and Schwarz   This application note describes how to use the mask and limit test features of the R&S®RTO, R&S®RTE and R&S®RTM Digital Oscilloscopes for EUT monitoring of signal forms, jitter etc. with the R&S®EMC32 Measurement Software.

Check Out the SI Journal White Paper Library

A variety of white papers and app notes from industry leading companies with practical “how to” topics.

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