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Teledyne LeCroy announced the addition of fully automated transmitter testing for 56-Gb/s, PAM4-based interfaces. The new QPHY-56G-PAM4 option adds standards-specific measurement capabilities to a measurement portfolio that already includes the PAM4 signal analysis capabilities pioneered by Teledyne LeCroy in recent years.

Tektronix, a leading worldwide provider of measurement solutions, today introduced the industry’s first 32 Gb/s protocol-aware bit error rate test and analysis system. The new Tektronix BSX series BERTScope not only helps characterize the receiver in Gen3 and Gen4 devices – it enables users to shorten the time needed to debug link training and bit error rate issues.

Sonoscan® has introduced the J610™, the latest member of its C-SAM® acoustic microscope line.  The J610 is a semi-automated tool designed for production environments and has an unusually large scan area. Its key role is finding internal structural defects by screening trays of loose components, wafers, board-mounted components and other suitably sized items.

Passive Plus Inc. has the 01005BB104 broadband 100 nF multilayer ceramic capacitors. The 01005BB104 — the industry’s smallest 100nF broadband part characterized for RF performance — has a case measuring (mils) 16 x 8 x 8, and offers resonant-free RF coupling/DC blocking from 16 KHz (lower 3-dB frequency) to beyond 65 GHz with < 1 dB insertion loss and < -15 dB return loss on suitable substrates. The 01005BB104 is rated at a DC working voltage (WVDC) of 4.0 and is available in a nickel-tin termination.

The new R&S RTO2000 model with 6 GHz bandwidth allows developers to test the radio interfaces of 802.11ac WLAN components for IoT modules in the 5 GHz band as well as fast communications interfaces such as USB 3.1 Gen 1 with data rates of 5 Gbit/s. Thanks to its multi-domain functionality, only a single compact instrument is needed to analyze power supplies, processors and sensors with up to 6 GHz bandwidth. Synchronized time, frequency, protocol and logic analyses results allow users to debug at the system level.

EDI CON China 2017, a conference that brings together engineers working on high-frequency analog and high-speed digital designs, taking place April 25-27 at the Shanghai Convention Center & Exhibition Center of International Sourcing (Shanghai, China), announces the keynote speaker for this year’s event will be Peter Rabbeni, Sr. Director RF BU Product Marketing at GLOBALFOUNDRIES. Rabbeni will bring his significant insights on semiconductor technology to bear on his talk entitled, “Technologies for the Next Wave of Mobile Data.”

Teledyne LeCroy, a worldwide leader in serial data test solutions, will showcase the world’s first Serial Attached SCSI 4.0 (SAS) live technology demonstration at DesignCon 2017. The next evolution of the enterprise storage standard, SAS 4.0 doubles the effective bandwidth over the current 12Gb/s SAS specification yet preserves backward compatibility to enable easier data center adoption. The Teledyne LeCroy exhibit will feature the Sierra T244 Protocol Analyzer platform, the first commercially available solution for testing and validating SAS 4.0 protocol.

Pickering Interfaces, a leading provider of modular signal switching and simulation for electronic test and verification, has expanded their range of High-Density 2 Amp PXI Multiplexers.