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Pulsonix™ announced the release of Pulsonix version 12.0, which adds capabilities, speed improvements, and highly requested usability enhancements. 

DL-ISO High Voltage Optically Isolated 1 GHz Probe and Power-Device test software, which when combined with High-Definition Oscilloscopes (HDO®) offer the most accurate electrical characterization of gallium nitride (GaN) and silicon carbide (SiC) power semiconductor devices.  

With the Enhanced Dynamic Front End, the R&S FSW will continue to offer the most advanced and highest quality signal and spectrum analysis on the market. 

CAES introduced a line of RadHard NOR Flash Memory devices that deliver the boot-memory densities required by microprocessors and FPGAs used in space applications.

Keysight Technologies, Inc. announced an end-to-end PCIe test solution for digital development and senior engineers that allow the simulation, pathfinding, characterization, validation, and compliance testing of PCIe designs.

Keysight Technologies, Inc. has introduced a 120 Giga Baud (GBd) High-Performance Bit Error Ratio Test (BERT) solution (M8050A) for validating chip deployments of up to 120 GBd. 

Rohde & Schwarz automation software allows for precise and time-saving compliance tests for IEEE 802.3 cable assemblies.

YINCAE announced that they have developed DA158N die attach materials, which are thermal conductive, and electrical insulating adhesives.

The features of the R&S BBA300 family include its continuous ultrawide frequency range from 380 MHz to 6 GHz in a single amplifier.

SiTime® Corporation introduced the Elite X™ Super-TCXO® for edge networks such as data centers, 5G front haul, connected cars, and industrial IoT. In these applications, Elite X solves critical timing problems and enables delivery of services.