Pat Hindle, SIJ Contributing Editor
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Pat Hindle

Pat Hindle is responsible for editorial content, article review and special industry reporting for Signal Integrity Journal and Microwave Journal magazines plus their web sites. He also leads social media and special digital projects. Prior to joining the Journals, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT's Space Nanostructures Laboratory. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

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