Signal Integrity Journal Webinar Series

Title: Serial Channel Measurements in the Time Domain

Date: March 29, 2022

Time: 8am PT / 11am ET

Presented by: Jay Diepenbrock, SI/RF Consultant at SIRF Consultants, LLC

Sponsored by:

Abstract:
This webinar will address some of the key measurements made to characterize a high-speed data channel in the time domain. The majority of high-speed channel standards specify quantities such as eye opening and jitter, insertion and return loss, and crosstalk, which are essential to understanding channel performance.  Additionally, bit error rate (BER) can be calculated if the test equipment has that capability.  These measurements are more complicated in recent days due to the movement from NRZ (non return to aero, also known as PAM-2) signaling to PAM-4 (4 level pulse amplitude modulation).  Jitter tolerance has also been added as a required measurement, along with calculation of channel operating margin (COM).  High channel loss and the resulting low signal to noise ratio (SNR) have necessitated the use of equalization and forward error correction (FEC); their effects on the channel performance will also be illustrated.  Sample test setups will be shown, along with examples of eye diagrams and measurements of their key parameters.

Presenter Bio:
Jay Diepenbrock holds a Sc. B. (EE) from Brown University and an MSEE from Syracuse University.  He worked in a number of development areas in IBM including IC, analog and RF circuit, and backplane design.  He then moved to IBM’s Integrated Supply Chain, working on the electrical specification, testing, and modeling of connectors and cables and was IBM’s Subject Matter Expert on high speed cables.  After a long career at IBM he left there and joined Lorom America as Senior Vice President, High Speed Engineering, and led the Lorom Signal Integrity team, supporting its high speed product development.  He left Lorom in 2015, and is now an independent consultant with SIRF Consultants, LLC.  Jay has authored or co-authored a number of technical papers, and contributed to a number of industry standards, is a Senior Member of the IEEE, and holds 12 patents.

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