Signal Integrity Journal Webinar Series

Title: Oscilloscope-Based Impedance Measurement - How it Compares and What You Need to Know

Now On Demand

Sponsored by: Rohde & Schwarz USA

Presented by: Steve Sandler, Founder and CEO of Picotest

Abstract:
In past webinars - How Oscilloscopes Will Evolve Over the Next 5 Years and Extending the Functionality of the Oscilloscope - I discussed the need for more advanced features including impedance, the need for more analysis, and the desire for a single-box solution. Ever since these webinars, there has been growing interest in the 2-port impedance measurement, which is traditionally measured using S-parameters in a vector network analyzer (VNA) and transforming to impedance. Many oscilloscope companies have at least tried it with their instruments. Modern 12-bit oscilloscopes provide increased resolution, but not close to the effective number of bits (ENOB) of a VNA. Using the oscilloscopes’ advanced FFT and spectrum analysis closes the gap quite a bit. The availability of an internal AFG makes the oscilloscope look a lot like a full featured frequency response analyzer (FRA)/VNA.

This webinar shows how the oscilloscope emulates a VNA to perform the 2-port impedance measurement, how the results compare to a traditional VNA, and what you need to know - both in terms of the continuing evolution and the pros and cons of using an oscilloscope for these types of frequency domain measurements.

Presenter Bio:
Steve Sandler has been involved with power system engineering for more than 40 years. Steve is the founder and CEO of Picotest, a company specializing in instruments and accessories for high performance power system and distributed system testing. He frequently lectures and leads workshops internationally on the topics of Power Integrity and Distributed Power System Design. He is a Keysight Certified EDA expert and was named DesignCon 2023’s Engineer of the Year.

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