Items Tagged with 'return loss'

Eric Bogatin shares four useful tools that illustrate the dynamic nature of propagating signals, promoting the understanding that is imperative to the design of high-performance products.

In this article covering next-generation USB technology, Keysight reviews IP/PHY development kits, simulation solutions, and T&M solutions that serve as the foundation for silicon and system integrators to design compliant USB4 Version 2.0 products that meet strict interoperability requirements in the vast Type-C ecosystem.