Articles Tagged with ''jitter''

SIJ gets Dr. McMillan’s take on what matters for noise generation in SI/PI design, and how PAM4 is arriving.

Since an oscilloscope and phase noise analyzer observe jitter differently, obtaining the same value from both instruments can be challenging. This article presents a phase-noise based methodology that provides similar values as time-interval error jitter derived from an oscilloscope.

This paper focuses on the importance of DCD jitter analysis at higher speed and heavier loading NAND systems, and introduces a statistical approach to DCD jitter analysis.

Here’s a look at how phase noise converts to time-interval error jitter, which is particularly important to those working on reference clocks for high-speed SERDES or sampling clocks. Read on to see how this can help debug systems to reduce sources of timing noise.

This article examines the key noise processes involved in measurements of jitter and phase noise, shows how these processes impact test results for various types of test equipment, and provides insight for interpreting these results.