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Cindy Cui is an Application Engineer with the EEsof Team at Keysight. She received her Master degree in Micro-Electronic from Tianjin University. She has over 6 years of service and support experience on high speed digital, RFIC design and device modeling at Keysight. Her focus is mainly on DDR4 Design, PCIe, IBIS modeling and the correlation between simulation and measurement. Before Keysight Cindy worked at Cadence for 4 years as the Application Engineer for Cadence simulation platform.
This paper focuses on the importance of DCD jitter analysis at higher speed and heavier loading NAND systems, and introduces a statistical approach to DCD jitter analysis.
Here's a proposed method that improves the accuracy of DDR4 statistical simulation by using the mask correction factor. It presents a validated correlation between measured and simulated data to show that this methodology can be effectively used for DDR4 design
