Articles by Eric Bogatin

Ask any engineer how to reduce the cross talk between two signal traces and the most common answer will be to add a guard trace. This should be the last resort, not the first choice. Guard traces can often introduce more problems than they solve.  Find out why in this article.

One reason I enjoy attending a conference is the opportunity to browse presentations I would not ordinarily see. I always pick up something new and useful. Here are some from my recent visit to the IEEE EMC Symposium.

One decision launched Todd Hubing on his current career path and has had a profound impact on the direction the EMC industry has taken over the last 35 years. Here's a summary of my interview with Todd.

On the first day of the 2019 IEEE EMC Symposium, Louann Mlekodaj, Eriko Yamato, Patrick DeRoy and other members of the EMC YP committee organized a Jeopardy game for the Young Professionals Group. As fitting the format of the Jeopardy show at an EMC event, answer categories covered, of course, EMC, SI and PI topics. Read on to test yourself!

Read on for a history of Touchstone and find out how you can shape its next iteration.

A TDR (time domain reflectometer) is an instrument that probably has the fastest rise time of any instrument in your lab, but how accurate is it? Eric tests accuracy using a DC Ohmmeter in this piece.

I received a demo version of a new quick and easy TDR. I decided to take it for a test drive by measuring all the cables I had lying around my lab. The results were surprising!

If performance matters, if the interconnects are not transparent, or if you want to develop good habits, you will want to incorporate these seven habits in your next two layer board design.

Wondering about the practical uses of the proposed IEEE P370 standard? This  paper shows some applications of the draft IEEE P370 standard in order to demonstrate its effectiveness for interconnect measurement.

The fixtures used to characterize interconnects in complex systems can have a significant effect on the measured data, read on to get the background and perspective on IEEE P370. Check out this Outstanding Paper Award Winner from EDI CON USA 2018.