Don DeGroot

Dr. Don DeGroot is the president of CCN, a test equipment and service business he co-founded in 2005 to support high-speed electronic design. Dr. DeGroot has over 30 years of experience in high-frequency electrical measurements and design, including a Ph.D. degree from Northwestern University and 12 years of research at NIST. From 2006-2015, Dr. DeGroot held a faculty position at Andrews University where he innovated project-based learning in electronic communications. He currently serves as chair of the IPC D24 subcommittee on high-speed and high-frequency test methods. Dr. DeGroot has published and presented over 100 technical papers on measurement science and electronic design research. He currently focuses on PCB interconnection and material characterization.

Apples-to-Apples Material Characterization for High-Speed PCB Design

September 4, 2019

Bill Hargin and Don DeGroot

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Engineers invest tens to hundreds of thousands of dollars in signal integrity simulation software—the goal being to gain an accurate understanding of how signals are going to behave in the final product. But how do you do that early in the design process without reliable, verifiable electrical properties for the dielectrics incorporated into your design?

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