Items Tagged with 'probes'

With the availability of both single-ended and differential oscilloscope probes, the question often arises as to which is best for probing low-speed differential serial data signals and why. The answer depends on trade-offs involving many factors. This article provides insight into factors to consider when choosing which type of probe is best for a given situation.  

Optimizing DDR5 memory system validation involves a strategic focus on probe and interposer solutions for in-system measurements. The selection of probe architecture, whether RC or RCRC, plays a key role in managing probe loading. To make the right choice, evaluating source impedance and signal characteristics, especially for bursted signaling, is essential. As DDR5 continues to evolve at higher speeds and reach its top speed phase, integrating non-ideal loading modeling within simulations and effectively de-embedding probe and interposer effects become critical components of a comprehensive testing plan.s