Items Tagged with 'jitter'

ARTICLES

PLL Characterization for Datacommunication Components and Systems Cover 2-27-24.jpg

PLL Characterization for Data Communication Components and Systems

Phase-locked loops (PLL) are used extensively throughout modern electronic systems. In data communication systems, PLLs are used in transmitter clock multipliers and receiver clock recovery circuits. A key performance factor for the PLL is how they manage jitter. A critical PLL metric is the jitter transfer function which is based on the PLL loop bandwidth. There are several measurement methods that can be used to characterize PLL loop bandwidth and jitter transfer. When operating on digital data signals, PLL bandwidth can vary with the data pattern. In this article, Greg Le Cheminant, Keysight Technologies, focuses on test methods that allow operation on data rather than only clock signals provide very high precision and useful insights into PLL behavior.


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DDR5 Input Clock Jitter Tests

DDR5 Electrical and Timing Measurement Techniques

In this article, Randy White discusses variations in clock timing and how this can impact the reliability of a memory system. White highlights the importance of considering probe calibration, random jitter removal, and controlling bandwidth for accurate measurements, providing examples that demonstrate why care must be taken during probe attachment, calibration, and using a jitter/noise analysis application to evaluate jitter levels, therefore ensuring memory reliability.


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Evaluating Oscillator Power Supply Noise Rejection: It’s the Total Jitter that Matters

Designers pushing the limits in their application can run into situations where the XO performance is inadequate for their next design due to the way it reacts to the noise and ripple in the power supply. To achieve optimal performance, they most likely will find they will need to do more than a simple datasheet evaluation to select their next XO. Read on for details on a PSNR test method to help select an optimal XO.


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