Items Tagged with 'S-Parameters'

“Over the years I’ve come to realize that, particularly in signal integrity, half-wave resonances are often the cause of ugly S-parameters. You can argue that any type of resonance would cause problems, and you would be right. However, half-wave resonances are easily formed in topologies.” This article summarizes observations from Gustavo Blando on the formation and mitigation of half-wave resonances, and includes an in-depth study on the topic in PDF format from the author.

SIJ editorial advisory board member Yuriy Shlepnev offers a comparison of three ways to visualize the same s-parameter data, identifying how to get the most information from a plot.

In the January 2021 print issue and the April 2021 online issue of the Signal Integrity Journal, I wrote an editorial in which I threw down a gauntlet to tool vendors to offer low cost or free versions of their tools to help engineers accelerate up the learning curve. Ansys picked up that gauntlet and now offers a free version of their industry standard electromagnetic simulator suite, Electronics Desktop. 

Signal integrity engineers almost always have to work with S-parameters. If you have not had to work with them yet, then chances are you will sometime in your career. As speed moves up in the double-digit GB/s regime, many industry standards are moving to serial link-based architectures and are using frequency domain compliance limits based on S-parameter measurements.

 “A few minutes upfront checking will save you hours of frustration later,” Eric Bogatin explains seven features of s-parameters

Read on for a history of Touchstone and find out how you can shape its next iteration.