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Timing components such as low jitter oscillators and clocks are necessary to facilitate increasing data rates in high speed digital designs.

EMI radiation and crosstalk caused by poor shielding can lead to signal quality and performance degradation in electronic RF devices. To minimize the overall EMI of electronic devices, local radiation sources on the integrated boards and modules must be well known.

To investigate the stability of a switched-mode power supply, a Bode plot created with an oscilloscope is ideal for checking the critical phase margin and gain margin values. The factors that determine how satisfactory the results from Bode plot measurements will be, need to taken into consideration as part of the preparation.

When analyzing the robustness of data transmission systems, jitter is a key indicator. It is recommended to use jitter measurement instruments for both the time and frequency domain in order to differentiate between fast and slow moving artifacts.

Billions of crystals are manufactured annually to be used in virtually every electronic device. From mobile phones and fitness trackers to cars and cell towers, crystals are the heart beat of products we depend on daily. Crystals are the fundamental building block of electronic oscillator circuits that create an electrical signal with precise frequency. Learn more with Epson’s Designer’s Guide to: Common Considerations when selecting a MHz Crystal.

A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations. This becomes even more important as supply voltages decrease and switching speed increases leading to tighter power rail tolerances and jitter requirements.

Impedance measurements with vector network analyzers require maximum precision. The R&S®ZNL from Rohde & Schwarz is able to characterize a broad range of impedances with the lowest uncertainty among its competitors in the same class. Learn more about our product and the solution.

The more successful a gate driver is in reducing power-up and power-down times, the bigger the headache for accurate measurements. Both choosing the right probe and optimizing the probing technique are significant factors in improving measurement accuracy. This white paper provides guidelines.

Today, R&D engineers face challenging time-to-market goals. In addtion a significant number of products in the development cycle fail EMC compliance the first time. Download our material and get new insights in EMI debugging.