Articles by Adrien Auge

This paper demonstrates a step-by-step correlation methodology adapted for DSP-based PCIe Gen5 and Gen6 IBIS-AMI models where one can measure and directly correlate raw errors out of the DSP on a test setup that is based on the receiver stress eye methodology of the PCIe standard.

This paper presents two modeling methodologies for ADC-based SerDes that mitigate IBIS-AMI architectural misalignments, and a corresponding model correlation methodology.