Mike Resso

Mike Resso is the Signal Integrity Application Scientist in the Internet Infrastructure Solution Group of Keysight Technologies and has over thirty years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high-speed digital interconnects using time domain reflectometry and vector network analysis. He has authored over 30 professional publications including two books on signal integrity. Mike has been awarded one U.S. patent and has twice received the Agilent “Spark of Insight” Award for his contribution to the company. He received a Bachelor of Science degree in Electrical and Computer Engineering from University of California.
Signal Integrity Application Scientist, Internet Infrastructure Solution Group,Keysight Technologies
Articles

ARTICLES

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Are 1.0 mm Precision RF Connectors Required for 224 Gbps PAM4 Verification?

DesignCon 2024 Best Paper Award Winner
October 15, 2024
Brandon Gore, Richard Mellitz, Andrew Josephson, Luis Boluña, John Calvin, Rick Rabinovich, and Mike Resso
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This paper, awarded the Best Paper Award at DesignCon 2024, explores what is meant by bandwidth during the standardization process, the implications of test and verification attached to certain bandwidth requirements, as well as differences between acquisition range, band limited filters, and s-parameters for time domain processing. 


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S-parameters: Signal Integrity Analysis in the Blink of an Eye

May 30, 2017
Alfred P. Neves and Mike Resso
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Emerging 100 Gigabit Ethernet and 400 Gigabit Ethernet requirements for communication networks have put increasing demands on Internet infrastructure. New methods of design, validation, and troubleshooting to optimize high speed digital channels are being employed in the R&D laboratory. This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.


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